TWI840945B

An automatic replacement method of contact modules for an IC Test Handler is disclosed, which is implemented in a control unit of the IC Test Handler, wherein the control unit executes an IC test mode and stores the test data in a test database. The automatic replacement method of contact modules in...

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Bibliographic Details
Main Author WU, XIN-LONG
Format Patent
LanguageChinese
Published 01.05.2024
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An automatic replacement method of contact modules for an IC Test Handler is disclosed, which is implemented in a control unit of the IC Test Handler, wherein the control unit executes an IC test mode and stores the test data in a test database. The automatic replacement method of contact modules includes: reading the test database; determining whether the test data in the test database meets a preset condition; if so, stopping the IC test mode and executing a contact module automatic replacement mode, so as to control a pick-and-place device to move a contact module out of a test connector base and place it in a waiting area, then obtaining a good product contact module in a spare area, and moving the good product contact module to the test connector base, and returning to execute the IC test mode; if not, directly returning to execute the IC test mode.
Bibliography:Application Number: TW202211134363