Cu ion sensor and cu ion sensing method

The present invention relates to a Cu ion sensor, which greatly improves the sensitivity to Cu by a nitrogen-rich surface of a copper nitride thin film doped with a metal material. The present invention also relates to a Cu ion sensing method, in which Cu2+ is detected by contacting the Cu ion senso...

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Bibliographic Details
Main Authors CHEN, SHENGI, CHIEN, KUAN-YU, SADHU, ANNADA SANKAR, CHUANG, MINN, BIRING, SAJAL
Format Patent
LanguageChinese
English
Published 21.01.2024
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:The present invention relates to a Cu ion sensor, which greatly improves the sensitivity to Cu by a nitrogen-rich surface of a copper nitride thin film doped with a metal material. The present invention also relates to a Cu ion sensing method, in which Cu2+ is detected by contacting the Cu ion sensor of the present invention with the solution to be tested, and using the change in electrical conductivity of a copper nitride film doped with a metal material in the presence of Cu2+ in the solution.
Bibliography:Application Number: TW202211139497