Semiconductor device, method of forming the same and layout design modification method of the same
A semiconductor device includes a substrate, a first cell and a second cell on the substrate. The first cell includes a first diffusion region in the substrate, a first gate structure over the first diffusion region, and a first contact over the first diffusion region. The first contact is disposed...
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Main Author | |
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Format | Patent |
Language | Chinese English |
Published |
11.01.2024
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device includes a substrate, a first cell and a second cell on the substrate. The first cell includes a first diffusion region in the substrate, a first gate structure over the first diffusion region, and a first contact over the first diffusion region. The first contact is disposed on one side of the first gate structure. The second cell that abuts the first cell includes a second diffusion region in the substrate, a second gate structure over the second diffusion region and a second contact over the second diffusion region. The second contact that is positioned on one side of the second gate structure is adjacent to the first contact of the first cell. The first contact and the second contact are equipotential when the semiconductor device is in operation. The second diffusion region and the first diffusion region form a continuous diffusion region. |
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Bibliography: | Application Number: TW202211140091 |