TWI802286B

The invention provides a laminating device calibration method and a piece of laminating equipment, which include: providing a laminating device installed with a laminating abut head; providing a calibration device installed with a distance sensor; enabling the distance sensor to measure different po...

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Bibliographic Details
Main Authors ZHANG, KAI-MIN, WANG, XUAN-XIANG, KE, YOU-LIAN
Format Patent
LanguageChinese
Published 11.05.2023
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Summary:The invention provides a laminating device calibration method and a piece of laminating equipment, which include: providing a laminating device installed with a laminating abut head; providing a calibration device installed with a distance sensor; enabling the distance sensor to measure different positions of the laminating abut head to obtain a plurality of measurement values, and adjusting the horizontal angle of the laminating abut head according to the measurement values. Therefore, the lamination device can be horizontally calibrated.
Bibliography:Application Number: TW202211106412