TWI799519B

An anti-reflection film (X) includes a laminated structure including a substrate (11), a hard coat layer (12), and an anti-reflection layer (13), and a luminous reflectance of the anti-reflection layer (13) side is 2% or less. A minimum value of a mandrel diameter indicating the bending resistance i...

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Bibliographic Details
Main Authors YOKOYAMA, MASASHI, SAKAKIBARA, TAKAHIRO
Format Patent
LanguageChinese
Published 21.04.2023
Subjects
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
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Summary:An anti-reflection film (X) includes a laminated structure including a substrate (11), a hard coat layer (12), and an anti-reflection layer (13), and a luminous reflectance of the anti-reflection layer (13) side is 2% or less. A minimum value of a mandrel diameter indicating the bending resistance is in a range of 6 mm or less in a bending test according to a cylindrical mandrel method in which the test piece of the anti-reflection film (X) is bent with the anti-reflection layer (13) side inward. Additionally or alternatively, a minimum value of the mandrel diameter indicating the bending resistance is in a range of 10 mm or less in a bending test according to a cylindrical mandrel method in which the test piece of the anti-reflection film (X) is bent with the anti-reflection layer (13) side outward. Such an anti-reflection film is suitable for achieving high bending resistance together with high anti-reflective properties.
Bibliography:Application Number: TW20198106269