Method and apparatus for depositing an epitaxial layer on a substrate wafer made of semiconductor material

A method and an apparatus for depositing an epitaxial layer on a substrate wafer made of semiconductor material. The method comprises the arrangement of the substrate wafer and a susceptor in a deposition device such that the substrate wafer rests on the susceptor and the susceptor is held by arms o...

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Bibliographic Details
Main Authors LICHTENEGGER, KORBINIAN, STETTNER, THOMAS, EDMAIER, WALTER, HECHT, HANNES
Format Patent
LanguageChinese
English
Published 01.05.2022
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Summary:A method and an apparatus for depositing an epitaxial layer on a substrate wafer made of semiconductor material. The method comprises the arrangement of the substrate wafer and a susceptor in a deposition device such that the substrate wafer rests on the susceptor and the susceptor is held by arms of a support shaft; monitoring whether a misalignment of the susceptor exists with respect to its position relative to the position of a pre-heating ring surrounding it; monitoring whether a misalignment of the support shaft exists with respect to its position relative to the position of the pre-heating ring; if at least one of the misalignments is present, elimination of the respective misalignment; and the deposition of the epitaxial layer on the substrate wafer.
Bibliography:Application Number: TW202110113361