Fusi gated device and method of forming the same

Various embodiments of the present disclosure are directed towards an integrated chip including a gate dielectric structure over a substrate. A metal layer overlies the gate dielectric structure. A conductive layer overlies the metal layer. A polysilicon layer contacts opposing sides of the conducti...

Full description

Saved in:
Bibliographic Details
Main Authors TUAN, HSIAOIN, THEI, KONG-BENG, CHOU, CHIENIH, KALNITSKY, ALEXANDER, WU, CHIA-HONG, LIN, TA-WEI, CHEN, YI-HUAN
Format Patent
LanguageChinese
English
Published 21.10.2020
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:Various embodiments of the present disclosure are directed towards an integrated chip including a gate dielectric structure over a substrate. A metal layer overlies the gate dielectric structure. A conductive layer overlies the metal layer. A polysilicon layer contacts opposing sides of the conductive layer. A bottom surface of the polysilicon layer is aligned with a bottom surface of the conductive layer. A dielectric layer overlies the polysilicon layer. The dielectric layer continuously extends from sidewalls of the polysilicon layer to an upper surface of the conductive layer.
Bibliography:Application Number: TW20198102536