TEST SYSTEM AND METHOD OF OPERATING THE SAME

A test system includes a plurality of test core devices and a plurality of first buses. The plurality of test core devices are electrically connected to a device under test (DUT). The plurality of first buses are electrically connected to the test core devices, where at least one set of test core de...

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Bibliographic Details
Main Authors LIU, MING HSIEN, HUANG, HSIN WEI
Format Patent
LanguageChinese
English
Published 01.10.2020
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Summary:A test system includes a plurality of test core devices and a plurality of first buses. The plurality of test core devices are electrically connected to a device under test (DUT). The plurality of first buses are electrically connected to the test core devices, where at least one set of test core devices selected from the plurality of test core devices are merged to be a merged test core device through one or more of the plurality of first buses.
Bibliography:Application Number: TW20198127260