A method of manufacturing semiconductor-on-insulator

The disclosed method is suitable for producing a semiconductor-on-insulator structure, such as a Ge(Si)-on-insulator structure or a Ge-on-insulator structure. According to the method, a multilayer comprising alternating pairs of layers, comprising a layer of silicon and a layer of germanium optional...

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Bibliographic Details
Main Authors THOMAS, SHAWN G, WANG, GANG
Format Patent
LanguageChinese
English
Published 11.07.2020
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Summary:The disclosed method is suitable for producing a semiconductor-on-insulator structure, such as a Ge(Si)-on-insulator structure or a Ge-on-insulator structure. According to the method, a multilayer comprising alternating pairs of layers, comprising a layer of silicon and a layer of germanium optionally with silicon is deposited on a silicon substrate comprising a germanium buffer layer. The multilayer is completed with a silicon passivation layer. A cleave plane is formed within the multilayer, and the multilayer structure is bonded to a handle substrate comprising a dielectric layer. The multilayer structure is cleaved along the cleave plane to thereby prepare a semiconductor-on-insulator structure comprising a semiconductor handle substrate, a dielectric layer, a silicon passivation layer, and at least a portion of the alternating pairs of layers, comprising a layer of silicon and a layer of germanium optionally with silicon.
Bibliography:Application Number: TW20165117272