Conductive contact and anisotropic conductive sheet with the same

• Main Authors: KIM, SUK MIN, JEON, JUNG SU, BAEK, BYEONG SEON
• Format: Patent
• Language: Chinese; English
• Published: 01.05.2020
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The present invention relates to an anisotropic conductive sheet used for a test socket or the like used to inspect a semiconductor element or the like and, more particularly, to an anisotropic conductive sheet comprising: a plurality of contact portions comprising conductive springs and conductive powder; and an insulating portion for supporting adjacent contact portions while insulating the same. The present invention provides an anisotropic conductive sheet arranged between an element (inspection target) and an inspection device so as to electrically connect a terminal of the element and a contact pad of the inspection device to each other. The anisotropic conductive sheet comprises: a plurality of conductive portions which are positioned to correspond to the terminal of the element and to the contact pad of the inspection device, and which have electric conductivity in the thickness direction; and an insulating portion which insulates adjacent contact portions from each other, and which supports the conta