Substrate processing method and substrate processing apparatus

A substrate processing method includes a chemical liquid supplying step of supplying a chemical liquid to a substrate, an elapsed period measuring step of measuring an after-the-end elapsed period, a recovery step of controlling the switching unit to be in a recovery guiding state, when, at a start...

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Main Authors MIURA, ATSUYASU, FUJITA, KAZUHIRO, TSUCHIHASHI, YUYA, TAKEMOTO, KENJI, TSUJIKAWA, HIROKI
Format Patent
LanguageChinese
English
Published 01.01.2020
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Summary:A substrate processing method includes a chemical liquid supplying step of supplying a chemical liquid to a substrate, an elapsed period measuring step of measuring an after-the-end elapsed period, a recovery step of controlling the switching unit to be in a recovery guiding state, when, at a start of the chemical liquid supplying step, the after-the-end elapsed period is less than a predetermined first period, and a draining step of controlling the switching unit to be in a drain guiding state, in which the liquid led to the recovery space is led to the drain line, when, at the start of the chemical liquid supplying step, the after-the-end elapsed period is not less than the predetermined first period and then switching to the recovery guiding state based on establishment of a predetermined draining ending condition.
Bibliography:Application Number: TW20176124134