OPTICAL MODELING METHOD AND ELECTRONIC APPARATUS USING THE SAME

• Main Authors: SHIH, WEI-WEN, WANG, SHIHANG, HSU, PIN-HAO
• Format: Patent
• Language: Chinese; English
• Published: 21.05.2018
• Subjects: COLORIMETRY; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; RADIATION PYROMETRY; TESTING

An optical modeling method and an electronic apparatus for building a target lens model are provided. The optical modeling method includes: calculating and generating a first lens model according to a spatial intensity distribution of a light source and a first target intensity distribution; introdu...