OPTICAL MODELING METHOD AND ELECTRONIC APPARATUS USING THE SAME

An optical modeling method and an electronic apparatus for building a target lens model are provided. The optical modeling method includes: calculating and generating a first lens model according to a spatial intensity distribution of a light source and a first target intensity distribution; introdu...

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Bibliographic Details
Main Authors SHIH, WEI-WEN, WANG, SHIHANG, HSU, PIN-HAO
Format Patent
LanguageChinese
English
Published 21.05.2018
Subjects
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:An optical modeling method and an electronic apparatus for building a target lens model are provided. The optical modeling method includes: calculating and generating a first lens model according to a spatial intensity distribution of a light source and a first target intensity distribution; introducing an external shape of the light source and calculating a first intensity distribution according to the spatial intensity distribution and the first lens model; obtaining a first difference level by comparing the first target intensity distribution and the first intensity distribution; taking the first lens model as the target lens model if the first difference level is not greater than preset threshold; otherwise, correcting the first target intensity distribution to a second target intensity distribution according to the first difference level, and calculating and generating a second lens model according to the spatial intensity distribution of the light source and the second target intensity distribution.
Bibliography:Application Number: TW20176112921