TWI606577B
A memory device includes a word line above a semiconductor substrate, a semiconductor pillar extending through the word line in a direction crossing a surface of the semiconductor substrate, a memory cell at an intersection of the word line and the semiconductor pillar and having a gate electrically...
Saved in:
Main Authors | , |
---|---|
Format | Patent |
Language | Chinese |
Published |
21.11.2017
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | A memory device includes a word line above a semiconductor substrate, a semiconductor pillar extending through the word line in a direction crossing a surface of the semiconductor substrate, a memory cell at an intersection of the word line and the semiconductor pillar and having a gate electrically connected to the word line, a bit line electrically connected to a first end of the memory cell, a source line electrically connected to a second end of the memory cell, and a controller that controls a write operation on the memory cell, the write operation including a program operation followed by a verify operation. During the verify operation on the memory cell, the semiconductor pillar is charged after performing a read operation on the memory cell. |
---|---|
Bibliography: | Application Number: TW20165107259 |