Active device array substrate and method of inspecting the same

• Main Author: PAN, YING HAO
• Format: Patent
• Language: Chinese; English
• Published: 11.01.2017
• Subjects: ADVERTISING; ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION; CRYPTOGRAPHY; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING; DISPLAY; EDUCATION; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL ANALOGUE/DIGITAL CONVERTERS; OPTICAL LOGIC ELEMENTS; OPTICS; PHYSICS; SEALS; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF

An active device array substrate is provided. The active device array substrate includes multiple pixel structures, a drive circuit, multiple signal lines and a control line. The pixel structures are disposed in a display area. The drive circuit is disposed outside the display area. The signal lines are electrically connected to the drive circuit and the pixel structures corresponded to the signal lines. The control lines are intersected with the signal lines. A method adapted for inspecting defects on the active device array substrate is also provided. First, a tested signal line is selected from the signal lines, and the control line and the tested-signal line are conducted. Second, a test signal is input from the control line to the tested-signal line to determine a location of a defect. Finally, the control line and the tested signal line are isolated.