System and method for scan-testing of idle functional units in operating systems

• Main Authors: KOCH, KRISTOFFER, PICALAUSA, JENNY
• Format: Patent
• Language: Chinese; English
• Published: 21.09.2016
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC COMMUNICATION TECHNIQUE; ELECTRIC DIGITAL DATA PROCESSING; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION