Probe for three-dimensional shape measurement apparatus

• Main Author: FUNABASHI, TAKANORI
• Format: Patent
• Language: Chinese; English
• Published: 11.08.2015
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention provides a detector used for a three-dimensional shape measuring device, and as measurement forces are small in the measurement of a vertical plane and a horizontal plane, vibration is hard to generate. The detector used for the three-dimensional shape measuring device has an installation part mounted on the three-dimensional shape measuring device, a swing part connected with the installation part in a swing manner, an arm support part maintained to move up and down with respect to the swing part, and an arm hung down from the lower end of the arm support part and configured at the lower part. The arm support part moving up and down with respect to the swing part comprises a swing side member, an arm side component, and five balls composed of magnetic bodies and contacted with vertical planes of swing side component and the arm side component opposite to each other. The balls are contacted with and roll between the swing side component and the arm side component under the action of magnetic att