Visual inspection apparatus, visual inspection methdo, and circumference inspection unit attachable to visual inspection apparatus

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Bibliographic Details
Main Authors HEBIISHI, HIROYASU, DOSAKA, SHINICHI, YOKOTA, ATSUTOSHI
Format Patent
LanguageChinese
English
Published 11.10.2013
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Bibliography:Application Number: TW20060114943