Method with the three dimensional outline measuring and the system of reconstruction which has a sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching

• Main Authors: YEH, MAU-SHIUN, KU, SHIH-LIANG, LIN, CHIA-HAU, LEE, JYH-FA, LIN, CHERN-SHENG
• Format: Patent
• Language: English
• Published: 01.10.2007
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention is a kind of method with the three dimensional outline measuring and the system of reconstruction which has the sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching. The method includes pre-step; projected step; video acquired step; video...