Method with the three dimensional outline measuring and the system of reconstruction which has a sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching
The invention is a kind of method with the three dimensional outline measuring and the system of reconstruction which has the sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching. The method includes pre-step; projected step; video acquired step; video...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
01.10.2007
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Subjects | |
Online Access | Get full text |
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Summary: | The invention is a kind of method with the three dimensional outline measuring and the system of reconstruction which has the sub-pixel positing of coloring optical gratings and single monitor with main and sub-frame switching. The method includes pre-step; projected step; video acquired step; video fine tuning step; video processing step; and reconstructive step. The system includes a projected apparatus which emits the beam from the optical grating to DUT; an image from the optical grating on DUT and has the same contrast on the plural grating lines; a CPU can reconstruct 3-D profile of DUT using optical grating imaging with fine tuning main and sub-frames. So achieved the optical grating has the same contrast to be easy to distinguish, the monitor has main- and sub-frames can be switched, and adjusting the optical grating with modified module. |
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Bibliography: | Application Number: TW20060133580 |