Method for measuring hysteresis curve and anisotropic energy of magnetic memory units

A method for measuring hysteresis curve and anisotropic energy of magnetic memory units is disclosed. It comprises gradually applying the different magnetic field to a single-layer or a multi-layer magnetic structure by extra-ordinary Hall effect (such as a MRAM memory unit), and recording the varia...

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Bibliographic Details
Main Authors WU, TEHO, WENG, MINGI, YE, LIN-HSIU, LEE, JIA-MOU
Format Patent
LanguageEnglish
Published 01.04.2007
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A method for measuring hysteresis curve and anisotropic energy of magnetic memory units is disclosed. It comprises gradually applying the different magnetic field to a single-layer or a multi-layer magnetic structure by extra-ordinary Hall effect (such as a MRAM memory unit), and recording the variation of Hall voltage to obtain the curves of hysteresis and anisotropic energy by instruments, and calculating the individual anisotropic energy value of magnetic material of the single-layer or the multi-layer magnetic structure.
Bibliography:Application Number: TW200695109489