Scanning con-focal microscope

A scanning con-focal microscope is provided for obtaining an observation image of a sample while changing the focal surface on the sample in the optical axis direction and constituting a three-dimensional image or an image of a large focal depth of the sample. The microscope includes a selection uni...

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Bibliographic Details
Main Authors HARAGUCHI, TADASHI, KANEGAE, SHIGERU, NISHIYAMA, YASUO
Format Patent
LanguageEnglish
Published 21.06.2006
Edition7
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Summary:A scanning con-focal microscope is provided for obtaining an observation image of a sample while changing the focal surface on the sample in the optical axis direction and constituting a three-dimensional image or an image of a large focal depth of the sample. The microscope includes a selection unit (33) for selecting a luminance signal of optimal wavelength band from a plurality of luminance signals having different wavelength bands which are output after photoelectrical conversion of the light from the sample by an image pickup unit and an image constituting unit (32) for using the luminance signal of the optimal wavelength band to constitute a three-dimensional image or an image of a large focal depth of the sample.
Bibliography:Application Number: TW20020132300