Inspecting an array of electronic components
The invention provides an apparatus and method for inspecting an array of electronic components. The apparatus comprises a scanning device adapted to capture images of at least one surface of each of the respective components, whereby to inspect said surface. The scanning device may be a line scanni...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
11.01.2006
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Summary: | The invention provides an apparatus and method for inspecting an array of electronic components. The apparatus comprises a scanning device adapted to capture images of at least one surface of each of the respective components, whereby to inspect said surface. The scanning device may be a line scanning device. |
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Bibliography: | Application Number: TW200493102985 |