Etching system and method for treating the etching solution thereof
The etching system of the present invention includes a processing trench having silicon-contained etching liquid, a cooling trench, a pre-heat trench, a first pipe capable of transferring the etching liquid from the processing trench to the cooling trench, a second pipe capable of transferring the e...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
01.07.2005
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Summary: | The etching system of the present invention includes a processing trench having silicon-contained etching liquid, a cooling trench, a pre-heat trench, a first pipe capable of transferring the etching liquid from the processing trench to the cooling trench, a second pipe capable of transferring the etching liquid from the cooling trench to the pre-heat trench, and a third pipe capable of transferring the etching liquid from the pre-heat trench to the processing trench. The method for treating the etching solution of the present invention comprises: first using an etching solution to perform an etching process for a silicon-contained film; next, cooling the etching to a first temperature so as to form a silicon-saturated etching liquid; and filtering the silicon-saturated liquid to remove silicide particles larger than a predetermined size, and then heating the same to a second temperature so as to form a non-saturated etching liquid for performing another etching process, where the second temperature is higher than the first temperature by at least 10 DEG C. |
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Bibliography: | Application Number: TW20040114904 |