Method of manufacturing electronic device

The subject application provides a method of manufacturing semiconductor device using lithography to form finer circuit pattern and to produce device with higher integration. In a method of forming a circuit pattern including fine pattern features and fine space, a hard mask layer is patterned with...

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Bibliographic Details
Main Authors OKAGAWA, TAKASHI, YAMAGUCHI, ATSUMI, YAMADA, TETSUYA, UENO, ATSUSHI, TSUJITA, KOUICHIROU
Format Patent
LanguageEnglish
Published 01.11.2004
Edition7
Subjects
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Summary:The subject application provides a method of manufacturing semiconductor device using lithography to form finer circuit pattern and to produce device with higher integration. In a method of forming a circuit pattern including fine pattern features and fine space, a hard mask layer is patterned with a first pattern defined by eliminating the fine space for merging the pattern features. Thereafter the hard mask layer is shrank. Next, the hard mask layer is patterned with a second pattern that is defined on the basis of the fine space. Finally, the circuit pattern is formed in an underlying layer using the hard mask layer as a mask.
Bibliography:Application Number: TW20030109888