Cleaning agent composition, method for cleaning and use thereof

An object of the present invention is to provide a new cleaning agent composition having excellent cleaning power for the surface contamination of a semiconductor wafer or various precisely worked instruments made of glass or ceramic, which is used in the manufacture of wafer; a method for cleaning...

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Bibliographic Details
Main Authors AMAMIYA, MASAHIRO, SAITO, SATOSHI, MATSUKI, KUNIO, YANO, KATSUJI
Format Patent
LanguageEnglish
Published 21.06.2004
Edition7
Subjects
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Summary:An object of the present invention is to provide a new cleaning agent composition having excellent cleaning power for the surface contamination of a semiconductor wafer or various precisely worked instruments made of glass or ceramic, which is used in the manufacture of wafer; a method for cleaning a wafer; a semiconductor wafer having a surface cleaned by a cleaning method; and a method for manufacturing a semiconductor wafer. A semiconductor wafer is cleaned using a cleaning agent composition including a specific fluorine-containing anionic surfactant, a quaternary ammonium hydroxide and/or an alkanolamine.
Bibliography:Application Number: TW20010104573