Methods to view and analyze the results from diffraction-based diagnostics

The present invention provides an analyzer useful in determining the presence of an analyte using a diffraction based sensing device and variety of different diffraction-based diagnostic methods and systems. The analyzer enhances the accuracy and/or usefulness of these devices in detecting analyzers...

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Bibliographic Details
Main Authors KNOTTS, MICHAEL EUGENE, KAYLOR, ROSANN MARIE, YANG, DIFEI, ATANASSOV, ZDRAVKO SAVOV
Format Patent
LanguageEnglish
Published 11.01.2004
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:The present invention provides an analyzer useful in determining the presence of an analyte using a diffraction based sensing device and variety of different diffraction-based diagnostic methods and systems. The analyzer enhances the accuracy and/or usefulness of these devices in detecting analyzers, while providing more ease-of-use and convenience to the user. The analyzer may include a light source, a photodiode, a microprocessor and a display system for informing the user of result. Other features include mirrors, lenses, a sample holder, and a mask for blocking out some light. The analyzer and related method and system may be used in a large number of environments, including commercial, professional, and individual.
Bibliography:Application Number: TW200291134586