Semiconductor integrated circuit
The subject of the present invention is to reduce the cost required for a test by shortening the time required for the test and by suppressing the increase of a chip area. A double-input AND gate g104 controlled by a scan enable signal wire n103 for performing a role of interrupting the transition o...
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| Main Author | |
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| Format | Patent |
| Language | English |
| Published |
01.12.2003
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| Edition | 7 |
| Subjects | |
| Online Access | Get full text |
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| Abstract | The subject of the present invention is to reduce the cost required for a test by shortening the time required for the test and by suppressing the increase of a chip area. A double-input AND gate g104 controlled by a scan enable signal wire n103 for performing a role of interrupting the transition of an output signal of g101 is inserted between an output terminal Q of a scan flip-flop g101 with an input switching gate and a logic output signal wire n102. |
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| AbstractList | The subject of the present invention is to reduce the cost required for a test by shortening the time required for the test and by suppressing the increase of a chip area. A double-input AND gate g104 controlled by a scan enable signal wire n103 for performing a role of interrupting the transition of an output signal of g101 is inserted between an output terminal Q of a scan flip-flop g101 with an input switching gate and a logic output signal wire n102. |
| Author | KONO, ICHIRO |
| Author_xml | – fullname: KONO, ICHIRO |
| BookMark | eNrjYmDJy89L5WRQCE7NzUzOz0spTS7JL1LIzCtJTS9KLElNUUjOLEouzSzhYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxIeGmZibGhhZOTsaEVQAA1agnCg |
| ContentType | Patent |
| DBID | EVB |
| DatabaseName | esp@cenet |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Medicine Chemistry Sciences Physics |
| Edition | 7 |
| ExternalDocumentID | TW564318BB |
| GroupedDBID | EVB |
| ID | FETCH-epo_espacenet_TW564318BB3 |
| IEDL.DBID | EVB |
| IngestDate | Fri Jul 19 12:30:37 EDT 2024 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-epo_espacenet_TW564318BB3 |
| Notes | Application Number: TW20010117546 |
| OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031201&DB=EPODOC&CC=TW&NR=564318B |
| ParticipantIDs | epo_espacenet_TW564318BB |
| PublicationCentury | 2000 |
| PublicationDate | 20031201 |
| PublicationDateYYYYMMDD | 2003-12-01 |
| PublicationDate_xml | – month: 12 year: 2003 text: 20031201 day: 01 |
| PublicationDecade | 2000 |
| PublicationYear | 2003 |
| RelatedCompanies | HITACHI, LTD |
| RelatedCompanies_xml | – name: HITACHI, LTD |
| Score | 2.575257 |
| Snippet | The subject of the present invention is to reduce the cost required for a test by shortening the time required for the test and by suppressing the increase of... |
| SourceID | epo |
| SourceType | Open Access Repository |
| SubjectTerms | BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE SEMICONDUCTOR DEVICES TESTING |
| Title | Semiconductor integrated circuit |
| URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20031201&DB=EPODOC&locale=&CC=TW&NR=564318B |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV1Lb4MwDLa67nnb2KbuzWHihiYgQXBAk3ipmtSHNrb2VpEQKi5QAdX-_pIMul16dSTnITm2k8-fAZ5dYtomyywd2xTrCKdUd3Ps6jYRxpTZmSl7Rk6m9vgTvS3xcgDrvhZG8oR-S3JEblGU23sr7-vN3yNWKLGVzQspuKh6jRMv1Prs2DK4Q9NC34vms3AWaEHgJQtt-u5h7nkNxz-AQxFDC5L96MsXJSmb__4kPoejOVdVthcwYKUCp0Hfdk2Bk0n3263AsYRn0oYLOxNsLkH9EHD2qhQ8rVWt7ugeMpUWNd0W7RU8xVESjHU-6Wq3vVWy6BbnW9cw5Ek_G4HKMpobjpNjzBDCBKU8kkAWzzayFLOcpDcw2qfldv_QHZz9gtEEHOMehm29ZQ_cqbbkUR7ID8XLfRE |
| link.rule.ids | 230,309,786,891,25594,76906 |
| linkProvider | European Patent Office |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwdV1LT8JAEJ4gPvCmVYNPejC9NQa6W9tDY9IWgkoL0SrcSPdRw6WQtsS_7-5a0AvX2WT2kczOzO433wDcu6Rn9zizTGxTbCKcUtPNsGvaRBoTs1lP9YyMYnv4gV5meNaAr00tjOIJ_VbkiMKiqLD3St3Xq79HrFBhK8sHshCi5dMg8UJjkx1bXeHQjND3-pNxOA6MIPCSqRG_eVh43q7j78H-o6TmlXHTpy9LUlb__cngBA4mQlVenUKD5xq0gk3bNQ2Oovq3W4NDBc-kpRDWJliegf4u4ezLXPK0Lgt9S_fAdLoo6HpRnUNn0E-CoSkmnW-3N0-m9eJ86wKaIunnbdA5o1nXcTKMOUKYoFREEsgS2QZLMc9IegntXVqudg91oDVMotF89By_XsPxLzBNQjNuoFkVa34rHGxF7tTh_ADHjX_- |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Semiconductor+integrated+circuit&rft.inventor=KONO%2C+ICHIRO&rft.date=2003-12-01&rft.externalDBID=B&rft.externalDocID=TW564318BB |