Thin film transistor with vertical structure
This invention provides a method for fabricating a thin film transistor with a vertical lightly-doped drain structure, which comprises: forming a buffer layer on an insulative transparent substrate, forming a polysilicon layer containing source/drain regions on the buffer layer, forming an insulativ...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
11.04.2003
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Summary: | This invention provides a method for fabricating a thin film transistor with a vertical lightly-doped drain structure, which comprises: forming a buffer layer on an insulative transparent substrate, forming a polysilicon layer containing source/drain regions on the buffer layer, forming an insulative layer on the polysilicon layer, forming a gate electrode on the insulative layer, forming an interlayer dielectric layer on the above-mentioned gate electrode, buffer layer and polysilicon layer, forming a via hole penetrating the above-mentioned interlayer dielectric layer to expose a portion of the source/drain region, forming an intrinsic silicon layer on the sidewall and bottom of the via hole; forming a heavily-doped silicon layer on the surface of the undoped silicon layer and covering the heavily-doped silicon layer with a metal layer. |
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Bibliography: | Application Number: TW20020100347 |