Probe testing device

A probe testing system is provided. The probe testing system includes a prober including a probe card and a chuck, a testing module including a measuring module and a channel switch controlling unit, and a testing platform. The measuring module is connected to the channel switch controlling unit and...

Full description

Saved in:
Bibliographic Details
Main Authors QUI, DON-LUNG, HO, MENG-YU, TSAI, MINGING
Format Patent
LanguageChinese
English
Published 16.07.2024
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:A probe testing system is provided. The probe testing system includes a prober including a probe card and a chuck, a testing module including a measuring module and a channel switch controlling unit, and a testing platform. The measuring module is connected to the channel switch controlling unit and the chuck, respectively. The channel switch controlling unit is connected with the probe card. The testing platform is disposed on the chuck, and is electrically connected with the chuck. Wherein the probe card is electrically connected with the testing platform selectively, and when the measuring module transmits a testing signal, the channel switch controlling unit, the probe card, the testing platform, the chuck and the measuring module forms an electrical route.
Bibliography:Application Number: TW202312101611