Probe suction nozzle unit, automatic probe replacement machine and automatic probe replacement method

The present invention is an automatic probe replacement machine and an automatic probe replacement method, in which an automatic design is adopted. Information of a probe to be replaced is obtained first by the automatic probe replacement machine to confirm the position of a probe to be replaced in...

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Bibliographic Details
Main Authors YANG, CHENGIA, LEE, SHIH-HUA, HSIEH, PING-HSIU, YU, TING-PEI, SUN, CHIA-PIN
Format Patent
LanguageChinese
English
Published 16.05.2024
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention is an automatic probe replacement machine and an automatic probe replacement method, in which an automatic design is adopted. Information of a probe to be replaced is obtained first by the automatic probe replacement machine to confirm the position of a probe to be replaced in a test socket. Then, the probe to be replaced is taken out from the test socket by a probe retrieval system, and a replacement probe is obtained from a probe supply system and placed in the corresponding position in the test socket, so that possible problems with manual probe removal or manual probe placement can be reduced. In a probe suction nozzle unit of the present invention, a suction part extends from a flat part to increase the suction success rate and reduce the interference to the adjacent probes. In addition, a thimble element can be added in the probe suction nozzle unit for the adjustment of the nozzle depth, so the probe suction nozzle unit can be applied to nozzles of various lengths.
Bibliography:Application Number: TW202211142261