Automatic replacement method of contact modules for IC Test Handler being implemented in a control unit of the IC Test Handler

• Main Author: WU, XIN-LONG
• Format: Patent
• Language: Chinese; English
• Published: 16.03.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An automatic replacement method of contact modules for an IC Test Handler is disclosed, which is implemented in a control unit of the IC Test Handler, wherein the control unit executes an IC test mode and stores the test data in a test database. The automatic replacement method of contact modules includes: reading the test database; determining whether the test data in the test database meets a preset condition; if so, stopping the IC test mode and executing a contact module automatic replacement mode, so as to control a pick-and-place device to move a contact module out of a test connector base and place it in a waiting area, then obtaining a good product contact module in a spare area, and moving the good product contact module to the test connector base, and returning to execute the IC test mode; if not, directly returning to execute the IC test mode.