Probe device for high-frequency signal testing including a signal shielding shell and at least two probes

• Main Authors: HSIEH, CHIEN-YU, HOU, CHIH-HUI
• Format: Patent
• Language: Chinese; English
• Published: 01.03.2024
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A probe device for high-frequency signal testing includes a signal shielding shell and at least two probes. At least two cylindrical accommodation spaces are spaced and provided in parallel in the signal shielding shell. The two adjacent cylindrical accommodation spaces communicate with each other and are spaced from each other by a distance. The cylindrical accommodation spaces are respectively formed with a through hole on two facing surfaces relative to the signal shielding shell, so that a test end and a telescopic end of each of the probes penetrate the through hole, respectively. An air gap is set between each of the probes and an inner wall of the cylindrical accommodation space, so that changing the distance and the size of the air gap can adjust a required matching impedance. Accordingly, the test ends and the telescopic ends transmit high-frequency signals by respectively contacting an object under test and an electricity socket, and shield interferences during transmissions to reduce detection erro