Substrate processing apparatus, substrate processing method and recording medium

To increase the dimensional stability of a resist pattern arranged by use of a metal-containing resist. A substrate processing apparatus includes a film forming processing unit configured to form a metal-containing resist film on a substrate; a heat treatment unit configured to perform a heating pro...

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Main Authors ENOMOTO, MASASHI, YAMAUCHI, TAKASHI, MIZUNOURA, HIROSHI, SANO, YOHEI, KAWAKAMI, SHINICHIRO
Format Patent
LanguageChinese
English
Published 16.01.2024
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Summary:To increase the dimensional stability of a resist pattern arranged by use of a metal-containing resist. A substrate processing apparatus includes a film forming processing unit configured to form a metal-containing resist film on a substrate; a heat treatment unit configured to perform a heating processing on the substrate on which the film is formed and in which an exposure processing is performed on the film; a developing processing unit configured to perform a developing processing on the film formed on the substrate on which the heating processing is performed; and an adjustment controller configured to reduce a difference between substrates in an amount of water that reacts in the film formed on the substrate during the heating processing.
Bibliography:Application Number: TW202312136588