Semiconductor device and methods of fabrication thereof

Embodiments of the present disclosure relate to methods of fabricating conductive features to prevent metal extrusion. Particularly, the conductive feature includes a control layer to reduce grain size of a metal containing layer, thus obtaining a robust structure to decrease extrusion defects. In s...

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Bibliographic Details
Main Authors NIAN, JUN-NAN, TSAI, JIAN-SHIN, CHUNG, MINGING, LIANG, YAO-HSIANG, LIAO, CHUN-I
Format Patent
LanguageChinese
English
Published 16.10.2023
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