Signal loss prevented test socket
The present invention relates to a test socket used to measure electrical characteristics of an electrical device. The present invention provides a test socket for signal loss protection, wherein the test socket is disposed between facing terminals and electrically connects the terminals. The test s...
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Main Authors | , , , |
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Format | Patent |
Language | Chinese English |
Published |
01.10.2023
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Subjects | |
Online Access | Get full text |
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Summary: | The present invention relates to a test socket used to measure electrical characteristics of an electrical device. The present invention provides a test socket for signal loss protection, wherein the test socket is disposed between facing terminals and electrically connects the terminals. The test socket is characterized by comprising: a plurality of first conductive parts having a first elastic matrix in the form of a column, both ends of which are in contact with facing power or signal terminals, and a plurality of first conductive particles arranged, inside the first elastic matrix, in the longitudinal direction of the first elastic matrix; a plurality of insulating supports configured to surround at least one of the plurality of first conductive parts; and a second conductive part which surrounds the plurality of insulating supports and of which both surfaces are in contact with a plurality of facing ground terminals. In the test socket for signal loss protection according to the present invention, signal |
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Bibliography: | Application Number: TW202211148512 |