Electrical connection assembly for test connector including a probe board and a wire type conductive film disposed on the probe board

• Main Author: WU, XIN-LONG
• Format: Patent
• Language: Chinese; English
• Published: 16.06.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An electrical connection assembly for a test connector is used in a semiconductor test system and served as a medium for electrical connection between an object under test, such as a semiconductor element or a wafer, and a test circuit board. The electrical connection assembly includes a probe board...