Semiconductor device and method for manufacturing the same

A method includes forming a first fin and a second fin protruding from a substrate; forming an isolation layer surrounding the first fin and the second fin; epitaxially growing a first epitaxial region on the first fin and a second epitaxial region on the second fin, wherein the first epitaxial regi...

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Bibliographic Details
Main Authors LIU, HAO-HENG, CHEN, YI-SHAN, TSAI, MING-HUAN, HUANG, YU-LIEN, CHANG, POIN
Format Patent
LanguageChinese
English
Published 16.05.2023
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Summary:A method includes forming a first fin and a second fin protruding from a substrate; forming an isolation layer surrounding the first fin and the second fin; epitaxially growing a first epitaxial region on the first fin and a second epitaxial region on the second fin, wherein the first epitaxial region and the second epitaxial region are merged together; performing an etching process on the first epitaxial region and the second epitaxial region, wherein the etching process separates the first epitaxial region from the second epitaxial region; depositing a dielectric material between the first epitaxial region and the second epitaxial region; and forming a first gate stack extending over the first fin.
Bibliography:Application Number: TW202211142618