Method for making semiconductor structure
A method for making a semiconductor structure includes forming a first fin and a second fin over a substrate. The method includes forming one or more work function layers over the first and second fins. The method includes forming a nitride-based metal film over the one or more work function layers....
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
16.02.2023
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Subjects | |
Online Access | Get full text |
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Summary: | A method for making a semiconductor structure includes forming a first fin and a second fin over a substrate. The method includes forming one or more work function layers over the first and second fins. The method includes forming a nitride-based metal film over the one or more work function layers. The method includes covering the first fin with a patternable layer. The method includes removing a second portion of the nitride-based metal film from the second fin, while leaving a first portion of the nitride-based metal film over the first fin substantially intact. |
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Bibliography: | Application Number: TW202211114421 |