Testing device

A testing device includes a probe platform, at least one arc-shaped rail and at least one probe module. The probe platform is formed with a placement area that is used to place a DUT. The arc-shaped rail is fixed on the probe platform, and the outer shape of the arc-shaped rail has an arc, and the p...

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Bibliographic Details
Main Authors WANG, CHINGUNG, JAO, JUI-HSIU
Format Patent
LanguageChinese
English
Published 16.11.2022
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A testing device includes a probe platform, at least one arc-shaped rail and at least one probe module. The probe platform is formed with a placement area that is used to place a DUT. The arc-shaped rail is fixed on the probe platform, and the outer shape of the arc-shaped rail has an arc, and the placement area is located within a range of the imaginary circle of curvature of this arc. The probe module includes a probe holder, a fixing part and a probe needle. The probe holder is slidably connected to the arc-shaped rail, the probe needle is arranged on the probe holder for touching the DUT, and the fixing part is used to removably fix the probe holder on the arc-shaped rail.
Bibliography:Application Number: TW202110116611