Test platform and test system for testing interface compatibility

A platform including a first base, a second base, a cable and a mechanical arm is provided. The first base includes a first test port configured to couple to a first input/output port of a device under test (DUT). The second base includes a first peripheral port and a second peripheral port. The fir...

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Bibliographic Details
Main Authors YI, CHUN-YANG, CHOU, SHIHIEH, CHANG, KUEI-SHAN, LIU, BIN
Format Patent
LanguageChinese
English
Published 16.11.2021
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:A platform including a first base, a second base, a cable and a mechanical arm is provided. The first base includes a first test port configured to couple to a first input/output port of a device under test (DUT). The second base includes a first peripheral port and a second peripheral port. The first peripheral port is configured to couple to a first peripheral device. The second peripheral port is configured to couple to a second peripheral device. The cable includes a first transmission port, a second transmission port and a connection line coupled between the first and second transmission ports. The mechanical arm is configured to move the first transmission port such that the first transmission port is coupled to the first test port. The mechanical arm is further configured to move the second transmission port such that the second transmission port is coupled to the first or second peripheral port.
Bibliography:Application Number: TW20209115500