Mass spectrometer and method for calibrating a mass spectrometer
The invention relates to a mass spectrometer (1), comprising: a gas inlet (2) adapted to supply a sample gas (4) to be ionized to an ionization region (5) of the mass spectrometer (1), a calibration unit (6) adapted to supply a calibration gas (7) to be ionized to the ionization region (5), and an i...
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Main Authors | , |
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Format | Patent |
Language | Chinese English |
Published |
01.08.2021
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Subjects | |
Online Access | Get full text |
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Summary: | The invention relates to a mass spectrometer (1), comprising: a gas inlet (2) adapted to supply a sample gas (4) to be ionized to an ionization region (5) of the mass spectrometer (1), a calibration unit (6) adapted to supply a calibration gas (7) to be ionized to the ionization region (5), and an ionization unit (8) adapted to ionize the sample gas (4) and/or the calibration gas (7) in the ionization region (5). The calibration unit (6) comprises at least one evaporation source (9) for generating the calibration gas (7) by evaporating a source material (10). The invention also relates to a method for calibrating a mass spectrometer (1). |
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Bibliography: | Application Number: TW20209136665 |