A test arrangement, an automated test equipment and a method for testing a device under test comprising a circuit and an antenna which is coupled to the circuit

• Main Authors: HESSELBARTH, JAN, MOREIRA, JOSE
• Format: Patent
• Language: Chinese; English
• Published: 01.03.2021
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An embodiment according to the present invention is a test arrangement for testing a DUT comprising an active circuit, and an antenna which is coupled to the circuit. The test arrangement comprises a DUT-location and a probe. Furthermore, the test arrangement comprises a ground area, which is configured to serve as an antenna ground area for an antenna of the DUT. The probe may be positioned, in a proximity of the ground area. The ground area comprises a tiny opening, such that the antenna feed impedance is not affected or not affected significantly. The DUT location is at a first side of the ground area while the probe is arranged at a second side of the ground area. The probe is adapted to weakly couple to the antenna of the DUT via the opening, in order to probe a signal when the antenna of the DUT is fed by the circuit of the DUT and/or in order to couple a signal to the antenna which is fed to the circuit of the DUT by the antenna.