Patterned wafer solder diffusion barrier

Methods and apparatus for an integrated circuit having with a frontside metal layer on the frontside of the substrate and a backside metal layer on the backside of the substrate. The backside metal layer is deposited onto the backside of the substrate and into the via such that a portion of the back...

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Bibliographic Details
Main Author DUVAL, PAUL J
Format Patent
LanguageChinese
English
Published 01.02.2021
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Summary:Methods and apparatus for an integrated circuit having with a frontside metal layer on the frontside of the substrate and a backside metal layer on the backside of the substrate. The backside metal layer is deposited onto the backside of the substrate and into the via such that a portion of the backside metal layer is connected to a portion of the frontside metal layer. A diffusion barrier layer is deposited on the backside metal layer located in the via.
Bibliography:Application Number: TW20209107703