Conductive nanowire measurement

A method of concurrently determining length and diameter of nanowires. Nanowires are provided onto a support. A chosen illumination of the nanowires on the support is provided. An image of the nanowires on the support is obtained. A length of each nanowire is calculated by an image processing progra...

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Bibliographic Details
Main Authors WOLK, JEFF ALAN, SPAID, MICHAEL ANDREW
Format Patent
LanguageChinese
English
Published 01.02.2021
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
NANOTECHNOLOGY
PERFORMING OPERATIONS
PHYSICS
SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
TESTING
TRANSPORTING
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Summary:A method of concurrently determining length and diameter of nanowires. Nanowires are provided onto a support. A chosen illumination of the nanowires on the support is provided. An image of the nanowires on the support is obtained. A length of each nanowire is calculated by an image processing program. A relative diameter of each nanowire is calculated based on an integrated intensity of light scattered per unit length from each nanowire.
Bibliography:Application Number: TW20209111298