Semiconductor back contact film and dicing tape integrated semiconductor back contact film suitable for suppressing warpage of a semiconductor wafer to which a semiconductor back contact film is attached
This invention provides a semiconductor back contact film suitable for suppressing warpage of a semiconductor wafer to which a semiconductor back contact film is attached in a process of manufacturing a semiconductor device, and a dicing tape integrated semiconductor back contact film. In a film 10...
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Main Authors | , , |
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Format | Patent |
Language | Chinese English |
Published |
01.11.2020
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Subjects | |
Online Access | Get full text |
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Summary: | This invention provides a semiconductor back contact film suitable for suppressing warpage of a semiconductor wafer to which a semiconductor back contact film is attached in a process of manufacturing a semiconductor device, and a dicing tape integrated semiconductor back contact film. In a film 10 (semiconductor back contact film) of the present invention, a difference in exothermic value between the exothermic value in the range of 50 to 200 DEG in a differential scanning calorimetry at a heating rate of 10 DEG/min and the exothermic value in the range of 50 to 200 DEG in a differential scanning calorimetry at a heating rate of 10 DEG/min after two hours of thermal treatment at 130 DEG C is 50 J/g or less. The dicing tape integrated semiconductor back contact film X of the present invention includes a film 10 and a dicing tape 20. The dicing tape 20 has a laminated structure including a base material 21 and an adhesive layer 22. The film 10 is peelably adhered to the adhesive layer 22 of the dicing tape 20. |
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Bibliography: | Application Number: TW20209106006 |