Horizontal double-sided probe device including a machine, at least one upper detection unit and at least one lower detection unit

• Main Authors: HUANG, RONG-SHU, GUO, JUN-TING, QIU, BANGNG
• Format: Patent
• Language: Chinese; English
• Published: 16.02.2020
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The present invention is a horizontal double-sided probe device, which includes a machine, at least one upper detection unit and at least one lower detection unit, wherein the machine includes a base, two lower slide rails and two upper slide rails, and the lower slide rail and the upper slide rail are located on the top surface of the base; each lower detection unit includes a lower seat rail and at least one lower probe member, the lower seat rail is slidably located on the lower slide rail, and the lower probe member is slidably disposed on the lower seat rail; and each upper detection unit includes an upper seat rail and at least one upper probe member, the upper seat rail is slidably located on the upper slide rail, and the upper probe member is slidably disposed on the upper seat rail. The horizontal double-sided probe device of the present invention simultaneously detects the top surface and the bottom surface of a carrier board by using the upper detection unit and the lower detection unit, and perfor