Probe assembly body to reinforce the rigidity of a positioning member so as to have good contact between each probe and each electrode of a plurality of test pads

Capable of reinforcing the rigidity of a positioning member so as to have good contact between each probe and each electrode of a plurality of test pads for inspection, and improving the workability during replacement. The probe assembly body of the present invention includes: a support member; and...

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Bibliographic Details
Main Authors SEINO, YOJI, SAITOH, TOYOKAZU
Format Patent
LanguageChinese
English
Published 01.01.2020
Subjects
ADVERTISING
CRYPTOGRAPHY
DISPLAY
DISPLAYING
EDUCATION
LABELS OR NAME-PLATES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEALS
SIGNS
TESTING
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Summary:Capable of reinforcing the rigidity of a positioning member so as to have good contact between each probe and each electrode of a plurality of test pads for inspection, and improving the workability during replacement. The probe assembly body of the present invention includes: a support member; and a plurality of probe groups, which allows a plurality of strip-shaped probes having a first contact portion in contact with a first contact object and a second contact portion in contact with a second contact object to be arranged in the lengthwise direction of the support member; one or a plurality of positioning members for penetrating the central region of each probe of each probe group so as to support each of the probe groups; and one or a plurality of reinforcing members arranged between the plurality of probe groups so as to support each positioning member.
Bibliography:Application Number: TW20198115316