X-ray inspection device
An X-ray inspection device of the present invention includes a sample placing unit 11 for placing a sample as an inspection target, a sample placing unit positioning mechanism 30 for moving the sample placing unit 11, a goniometer 20 including first and second rotation members 22 and 23 rotating ind...
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Main Authors | , , , , , , , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
01.08.2019
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Subjects | |
Online Access | Get full text |
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