Appearance inspection apparatus
An appearance inspection apparatus for inspecting a top surface and at least one side surface bordered on the top surface of at least one chip is provided. The chip is disposed on an expandable film. The appearance inspection apparatus includes at least one reflecting mirror, a photography unit, and...
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| Main Authors | , , |
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| Format | Patent |
| Language | Chinese English |
| Published |
16.10.2017
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| Subjects | |
| Online Access | Get full text |
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| Abstract | An appearance inspection apparatus for inspecting a top surface and at least one side surface bordered on the top surface of at least one chip is provided. The chip is disposed on an expandable film. The appearance inspection apparatus includes at least one reflecting mirror, a photography unit, and a computing unit. The reflecting mirror is corresponding to at least one side surface of the at least one chip. The photography unit for photographing image of the top surface of the at least one chip directly, and photographing image of the at least one side surface of the at least one chip via the at least one reflecting mirror indirectly. The computing unit coupled to the photography unit to analyze the images of the top surface and the at least one side surface of the at least one chip. |
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| AbstractList | An appearance inspection apparatus for inspecting a top surface and at least one side surface bordered on the top surface of at least one chip is provided. The chip is disposed on an expandable film. The appearance inspection apparatus includes at least one reflecting mirror, a photography unit, and a computing unit. The reflecting mirror is corresponding to at least one side surface of the at least one chip. The photography unit for photographing image of the top surface of the at least one chip directly, and photographing image of the at least one side surface of the at least one chip via the at least one reflecting mirror indirectly. The computing unit coupled to the photography unit to analyze the images of the top surface and the at least one side surface of the at least one chip. |
| Author | CHOU, MING-HAO HSIEH, HUANUN TSAI, CHEN-YANG |
| Author_xml | – fullname: TSAI, CHEN-YANG – fullname: CHOU, MING-HAO – fullname: HSIEH, HUANUN |
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| Notes | Application Number: TW20160110787 |
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| Snippet | An appearance inspection apparatus for inspecting a top surface and at least one side surface bordered on the top surface of at least one chip is provided. The... |
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| SubjectTerms | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| Title | Appearance inspection apparatus |
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